Growth of DyBa2Cu3O7-x studied by scanning tunneling microscopy

Scanning tunneling microscopy (STM) has been used to investigate the microstructure of DyBa2Cu3O7−x films grown on (100) SrTiO3 by ozone-assisted molecular beam epitaxy. The surface roughness is found to be higher than that reported for sputtered films of YBa2Cu3O7−x. Intensity oscillations were obs...

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Veröffentlicht in:	Applied physics letters 1992-05, Vol.60 (19), p.2424-2426
Hauptverfasser:	CHANDRASEKHAR, N, AGRAWAL, V, ACHULTHARAMAN, V. S, GOLDMAN, A. M
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Physics Solid surfaces and solid-solid interfaces Surface and interface dynamics and vibrations Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology
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Zusammenfassung:	Scanning tunneling microscopy (STM) has been used to investigate the microstructure of DyBa2Cu3O7−x films grown on (100) SrTiO3 by ozone-assisted molecular beam epitaxy. The surface roughness is found to be higher than that reported for sputtered films of YBa2Cu3O7−x. Intensity oscillations were observed in the specular spot of in situ reflection high energy electron diffraction patterns, a result which suggests that surface smoothness is not a requisite for the observation of such intensity oscillations. The observation of spiral morphology in STM pictures indicates the presence of screw dislocations, in excess of 109 cm−2. A zeroth order approximation has been used to evaluate the shapes of the spirals and reasonable agreement is obtained with experiment.
ISSN:	0003-6951 1077-3118
DOI:	10.1063/1.106993