Optically detected electron paramagnetic resonance of arsenic antisites in low-temperature GaAs layers

Arsenic antisites in GaAs layers grown by molecular-beam epitaxy at low substrate temperatures (∼200 °C) were observed using electron paramagnetic resonance (EPR), magnetic circular dichroism in absorption (MCDA), and MCDA-detected EPR. This observation confirms that there is a MCDA band directly as...

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Veröffentlicht in:Applied physics letters 1992-02, Vol.60 (6), p.718-720
Hauptverfasser: SUN, H.-J, WATKINS, G. D, RONG, F. C, FOTIADIS, L, POINDEXTER, E. H
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container_issue 6
container_start_page 718
container_title Applied physics letters
container_volume 60
creator SUN, H.-J
WATKINS, G. D
RONG, F. C
FOTIADIS, L
POINDEXTER, E. H
description Arsenic antisites in GaAs layers grown by molecular-beam epitaxy at low substrate temperatures (∼200 °C) were observed using electron paramagnetic resonance (EPR), magnetic circular dichroism in absorption (MCDA), and MCDA-detected EPR. This observation confirms that there is a MCDA band directly associated with arsenic antisites in the GaAs layers.
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1077-3118
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subjects Color centers and other defects
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Electron paramagnetic resonance and relaxation
Exact sciences and technology
Magnetic resonances and relaxations in condensed matter, mössbauer effect
Physics
title Optically detected electron paramagnetic resonance of arsenic antisites in low-temperature GaAs layers
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