Grating spectrograph in InGaAsP/InP for dense wavelength division multiplexing

Grating spectrograph in InGaAsP/InP for dense wavelength division multiplexing

A grating spectrograph in InGaAsP/InP suitable for use in the wavelength region from 1.2 to 1.6 μm is presented. Experiments for devices with a channel spacing of 3.7 nm and more than 30 channels between 1.48 and 1.59 μm are described. The measured cross talk level is below −25 dB. The devices have...

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Veröffentlicht in:Applied physics letters 1991-08, Vol.59 (6), p.627-629
Hauptverfasser: CREMER, C, EBBINGHAUS, G, HEISE, G, MÜLLER-NAWRATH, R, SCHIENLE, M, STOLL, L
Format: Artikel
Sprache:eng
Schlagworte:
Applied sciences
Circuit properties
Electric, optical and optoelectronic circuits
Electronics
Exact sciences and technology
Optical and optoelectronic circuits
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Zusammenfassung:A grating spectrograph in InGaAsP/InP suitable for use in the wavelength region from 1.2 to 1.6 μm is presented. Experiments for devices with a channel spacing of 3.7 nm and more than 30 channels between 1.48 and 1.59 μm are described. The measured cross talk level is below −25 dB. The devices have only very low polarization sensitivity. This spectrograph is suited for monolithic integration with photodiodes, laser diodes, or optical amplifiers on a single chip.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.105405