Simultaneous measurement of lateral and normal forces with an optical-beam-deflection atomic force microscope

Simultaneous measurement of lateral and normal forces with an optical-beam-deflection atomic force microscope

An atomic force microscope capable of measuring, simultaneously yet separately, lateral (‘‘frictional’’) and normal forces is described. A direction-dependent feature, absent in topological images, is found when scanning stepped surfaces of NaCl (001) in ultrahigh vacuum. A simple model is presented...

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Veröffentlicht in:Applied physics letters 1990-11, Vol.57 (20), p.2089-2091
Hauptverfasser: MEYER, G, AMER, N. M
Format: Artikel
Sprache:eng
Schlagworte:
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
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Beschreibung
Zusammenfassung:An atomic force microscope capable of measuring, simultaneously yet separately, lateral (‘‘frictional’’) and normal forces is described. A direction-dependent feature, absent in topological images, is found when scanning stepped surfaces of NaCl (001) in ultrahigh vacuum. A simple model is presented to account for this observation.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.103950