Wafer fusion : a novel technique for optoelectronic device fabrication and monolithic integration

Centimeter-size single-crystal InP or GaAs wafers have been fused together entirely, face to face or side by side, after a heat treatment in a graphite/quartz reactor which can press the wafers together through differential thermal expansion. Diodes formed by fusing p- and n-type wafers showed norma...

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Veröffentlicht in:Applied physics letters 1990-02, Vol.56 (8), p.737-739
Hauptverfasser: LIAU, Z. L, MULL, D. E
Format: Artikel
Sprache:eng
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Zusammenfassung:Centimeter-size single-crystal InP or GaAs wafers have been fused together entirely, face to face or side by side, after a heat treatment in a graphite/quartz reactor which can press the wafers together through differential thermal expansion. Diodes formed by fusing p- and n-type wafers showed normal current-voltage characteristics and light emission. Fusion between lattice-mismatched wafers (i.e., InP and GaAs) has also been demonstrated.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.102697