An investigation of systematic errors in interactive EXELFS analysis

Analyzing the fine structure modulations occurring on the high energy side of the ionization edges in atomic spectra, the EXELFS (EXtended Energy-Loss Fine Structure), can provide important structural and chemical information about the local atomic environment. The analysis procedure is, however, so...

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Veröffentlicht in:	Microscopy microanalysis microstructures (Les Ulis) 1990-06, Vol.1 (3), p.199-213
Hauptverfasser:	Mohammad Amirhamzeh Tafreshi, Bohm, Christian, Csillag, Stefan
Format:	Artikel
Sprache:	eng
Schlagworte:	6118 Atomic structure EEL spectroscopy Errors Experimental study Fine structure Investigation method Local structure
Online-Zugang:	Volltext
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