Front cover: An efficient built‐in error detection methodology with fast page‐oriented data comparison in 3D NAND flash memories
The cover image is based on the Original Article An efficient built‐in error detection methodology with fast page‐oriented data comparison in 3D NAND flash memories by Zongliang Huo et al., https://doi.org/10.1049/ell2.12484.
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| Veröffentlicht in: | Electronics letters 2022-06, Vol.58 (12), p.i-i |
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| Hauptverfasser: | , , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
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| Zusammenfassung: | The cover image is based on the Original Article An efficient built‐in error detection methodology with fast page‐oriented data comparison in 3D NAND flash memories by Zongliang Huo et al., https://doi.org/10.1049/ell2.12484. |
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| ISSN: | 0013-5194 1350-911X |
| DOI: | 10.1049/ell2.12528 |