Front Cover: A frequency mapping method for locating functional units inside ICs based on coaxial microscope

Front Cover: A frequency mapping method for locating functional units inside ICs based on coaxial microscope

The cover image is based on the Original Article A frequency mapping method for locating functional units inside ICs based on coaxial microscope by Yingqi Ma et al., https://doi.org/10.1049/ell2.12373.

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Veröffentlicht in:Electronics letters 2022-02, Vol.58 (3), p.i-i
Hauptverfasser: Liu, Pengcheng, Han, Jianwei, Ma, Yingqi, Zhang, Feng, Wu, Zongguo, Zhu, Xiang, Cui, Yixin
Format: Artikel
Sprache:eng
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Zusammenfassung:The cover image is based on the Original Article A frequency mapping method for locating functional units inside ICs based on coaxial microscope by Yingqi Ma et al., https://doi.org/10.1049/ell2.12373.
ISSN:0013-5194
1350-911X
DOI:10.1049/ell2.12430