Throughput improvement by reliability-dependent layer allocation in IDM

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Veröffentlicht in:	Electronics letters 2008-07, Vol.44 (16), p.958-960
Hauptverfasser:	KHAN, A, FRICKE, J. Ch, HOEHER, P. A
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Sprache:	eng
Schlagworte:	Applied sciences Exact sciences and technology Systems, networks and services of telecommunications Telecommunications Telecommunications and information theory Transmission and modulation (techniques and equipments)
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container_end_page	960
container_issue	16
container_start_page	958
container_title	Electronics letters
container_volume	44
creator	KHAN, A FRICKE, J. Ch HOEHER, P. A
description
doi_str_mv	10.1049/el:20081084
format	Article
fullrecord	<record><control><sourceid>pascalfrancis_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1049_el_20081084</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>20561600</sourcerecordid><originalsourceid>FETCH-LOGICAL-c221t-87c304c3e27df7be6e265f29f6832ed9ea2eb53dd75dcf38be586c911d58034e3</originalsourceid><addsrcrecordid>eNo9UE9LwzAcDaLgnJ78Ar14kuovSdMm3mTOOZh4meCtpMkvLpK1JemEfns3pp4ej_cH3iPkmsIdhULdY3hgAJKCLE7IhHIBuaL045RMACjPBVXFOblI6WtPmVLVhCzWm9jtPjf9bsj8to_dN26xHbJmzCIGrxsf_DDmFnts7UEIesSY6RA6owfftZlvs-XT6yU5czokvPrFKXl_nq9nL_nqbbGcPa5ywxgdclkZDoXhyCrrqgZLZKVwTLlScoZWoWbYCG5tJaxxXDYoZGn2G6yQwAvkU3J77DWxSymiq_votzqONYX68EGNof77YO--Obp7nYwOLurW-PQfYSBKWgLwH1e5XO4</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Throughput improvement by reliability-dependent layer allocation in IDM</title><source>Alma/SFX Local Collection</source><creator>KHAN, A ; FRICKE, J. Ch ; HOEHER, P. A</creator><creatorcontrib>KHAN, A ; FRICKE, J. Ch ; HOEHER, P. A</creatorcontrib><identifier>ISSN: 0013-5194</identifier><identifier>EISSN: 1350-911X</identifier><identifier>DOI: 10.1049/el:20081084</identifier><identifier>CODEN: ELLEAK</identifier><language>eng</language><publisher>London: Institution of Electrical Engineers</publisher><subject>Applied sciences ; Exact sciences and technology ; Systems, networks and services of telecommunications ; Telecommunications ; Telecommunications and information theory ; Transmission and modulation (techniques and equipments)</subject><ispartof>Electronics letters, 2008-07, Vol.44 (16), p.958-960</ispartof><rights>2008 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c221t-87c304c3e27df7be6e265f29f6832ed9ea2eb53dd75dcf38be586c911d58034e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>315,782,786,27931,27932</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=20561600$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>KHAN, A</creatorcontrib><creatorcontrib>FRICKE, J. Ch</creatorcontrib><creatorcontrib>HOEHER, P. A</creatorcontrib><title>Throughput improvement by reliability-dependent layer allocation in IDM</title><title>Electronics letters</title><subject>Applied sciences</subject><subject>Exact sciences and technology</subject><subject>Systems, networks and services of telecommunications</subject><subject>Telecommunications</subject><subject>Telecommunications and information theory</subject><subject>Transmission and modulation (techniques and equipments)</subject><issn>0013-5194</issn><issn>1350-911X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><recordid>eNo9UE9LwzAcDaLgnJ78Ar14kuovSdMm3mTOOZh4meCtpMkvLpK1JemEfns3pp4ej_cH3iPkmsIdhULdY3hgAJKCLE7IhHIBuaL045RMACjPBVXFOblI6WtPmVLVhCzWm9jtPjf9bsj8to_dN26xHbJmzCIGrxsf_DDmFnts7UEIesSY6RA6owfftZlvs-XT6yU5czokvPrFKXl_nq9nL_nqbbGcPa5ywxgdclkZDoXhyCrrqgZLZKVwTLlScoZWoWbYCG5tJaxxXDYoZGn2G6yQwAvkU3J77DWxSymiq_votzqONYX68EGNof77YO--Obp7nYwOLurW-PQfYSBKWgLwH1e5XO4</recordid><startdate>20080731</startdate><enddate>20080731</enddate><creator>KHAN, A</creator><creator>FRICKE, J. Ch</creator><creator>HOEHER, P. A</creator><general>Institution of Electrical Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20080731</creationdate><title>Throughput improvement by reliability-dependent layer allocation in IDM</title><author>KHAN, A ; FRICKE, J. Ch ; HOEHER, P. A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c221t-87c304c3e27df7be6e265f29f6832ed9ea2eb53dd75dcf38be586c911d58034e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Applied sciences</topic><topic>Exact sciences and technology</topic><topic>Systems, networks and services of telecommunications</topic><topic>Telecommunications</topic><topic>Telecommunications and information theory</topic><topic>Transmission and modulation (techniques and equipments)</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>KHAN, A</creatorcontrib><creatorcontrib>FRICKE, J. Ch</creatorcontrib><creatorcontrib>HOEHER, P. A</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><jtitle>Electronics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>KHAN, A</au><au>FRICKE, J. Ch</au><au>HOEHER, P. A</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Throughput improvement by reliability-dependent layer allocation in IDM</atitle><jtitle>Electronics letters</jtitle><date>2008-07-31</date><risdate>2008</risdate><volume>44</volume><issue>16</issue><spage>958</spage><epage>960</epage><pages>958-960</pages><issn>0013-5194</issn><eissn>1350-911X</eissn><coden>ELLEAK</coden><cop>London</cop><pub>Institution of Electrical Engineers</pub><doi>10.1049/el:20081084</doi><tpages>3</tpages></addata></record>
fulltext	fulltext
identifier	ISSN: 0013-5194
ispartof	Electronics letters, 2008-07, Vol.44 (16), p.958-960
issn	0013-5194 1350-911X
language	eng
recordid	cdi_crossref_primary_10_1049_el_20081084
source	Alma/SFX Local Collection
subjects	Applied sciences Exact sciences and technology Systems, networks and services of telecommunications Telecommunications Telecommunications and information theory Transmission and modulation (techniques and equipments)
title	Throughput improvement by reliability-dependent layer allocation in IDM
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-04T23%3A54%3A51IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Throughput%20improvement%20by%20reliability-dependent%20layer%20allocation%20in%20IDM&rft.jtitle=Electronics%20letters&rft.au=KHAN,%20A&rft.date=2008-07-31&rft.volume=44&rft.issue=16&rft.spage=958&rft.epage=960&rft.pages=958-960&rft.issn=0013-5194&rft.eissn=1350-911X&rft.coden=ELLEAK&rft_id=info:doi/10.1049/el:20081084&rft_dat=%3Cpascalfrancis_cross%3E20561600%3C/pascalfrancis_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true