Random numbers from metastability and thermal noise
Gespeichert in:
| Veröffentlicht in: | Electronics letters 2005-08, Vol.41 (16), p.891-893 |
|---|---|
| Hauptverfasser: | , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 893 |
|---|---|
| container_issue | 16 |
| container_start_page | 891 |
| container_title | Electronics letters |
| container_volume | 41 |
| creator | RANASINGHE, D. C LIM, D DEVADAS, S ABBOTT, D COLE, P. H |
| description | |
| doi_str_mv | 10.1049/el:20051559 |
| format | Article |
| fullrecord | <record><control><sourceid>pascalfrancis_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1049_el_20051559</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>17017075</sourcerecordid><originalsourceid>FETCH-LOGICAL-c300t-ac23f9e3dd29c07485fe25c4ae769978bb8be3b0cfae70da255577ac287b0c8f3</originalsourceid><addsrcrecordid>eNpFj0FLxDAQhYMoWFdP_oFePEndSdKYxpssrgoLC6LgrUzSCVbSdknqYf-9kVWEgeE9vjfDY-ySww2H2iwp3AkAxZUyR6zgUkFlOH8_ZgUAl5Xipj5lZyl9ZimM0QWTLzh201COX4OlmEofsxhoxjSj7UM_78sMlPMHxQFDOU59onN24jEkuvjdC_a2fnhdPVWb7ePz6n5TOQkwV-iE9IZk1wnjQNeN8iSUq5H0bf7dWNtYkhaczw50KJRSWudUo7PZeLlg14e7Lk4pRfLtLvYDxn3Lof3p21Jo__pm-upA7zA5DD7i6Pr0H9GQRyv5Df6oVao</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Random numbers from metastability and thermal noise</title><source>Alma/SFX Local Collection</source><creator>RANASINGHE, D. C ; LIM, D ; DEVADAS, S ; ABBOTT, D ; COLE, P. H</creator><creatorcontrib>RANASINGHE, D. C ; LIM, D ; DEVADAS, S ; ABBOTT, D ; COLE, P. H</creatorcontrib><identifier>ISSN: 0013-5194</identifier><identifier>EISSN: 1350-911X</identifier><identifier>DOI: 10.1049/el:20051559</identifier><identifier>CODEN: ELLEAK</identifier><language>eng</language><publisher>London: Institution of Electrical Engineers</publisher><subject>Applied sciences ; Design. Technologies. Operation analysis. Testing ; Electronics ; Exact sciences and technology ; Integrated circuits ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><ispartof>Electronics letters, 2005-08, Vol.41 (16), p.891-893</ispartof><rights>2005 INIST-CNRS</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c300t-ac23f9e3dd29c07485fe25c4ae769978bb8be3b0cfae70da255577ac287b0c8f3</citedby><cites>FETCH-LOGICAL-c300t-ac23f9e3dd29c07485fe25c4ae769978bb8be3b0cfae70da255577ac287b0c8f3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27923,27924</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=17017075$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>RANASINGHE, D. C</creatorcontrib><creatorcontrib>LIM, D</creatorcontrib><creatorcontrib>DEVADAS, S</creatorcontrib><creatorcontrib>ABBOTT, D</creatorcontrib><creatorcontrib>COLE, P. H</creatorcontrib><title>Random numbers from metastability and thermal noise</title><title>Electronics letters</title><subject>Applied sciences</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Integrated circuits</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><issn>0013-5194</issn><issn>1350-911X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNpFj0FLxDAQhYMoWFdP_oFePEndSdKYxpssrgoLC6LgrUzSCVbSdknqYf-9kVWEgeE9vjfDY-ySww2H2iwp3AkAxZUyR6zgUkFlOH8_ZgUAl5Xipj5lZyl9ZimM0QWTLzh201COX4OlmEofsxhoxjSj7UM_78sMlPMHxQFDOU59onN24jEkuvjdC_a2fnhdPVWb7ePz6n5TOQkwV-iE9IZk1wnjQNeN8iSUq5H0bf7dWNtYkhaczw50KJRSWudUo7PZeLlg14e7Lk4pRfLtLvYDxn3Lof3p21Jo__pm-upA7zA5DD7i6Pr0H9GQRyv5Df6oVao</recordid><startdate>20050804</startdate><enddate>20050804</enddate><creator>RANASINGHE, D. C</creator><creator>LIM, D</creator><creator>DEVADAS, S</creator><creator>ABBOTT, D</creator><creator>COLE, P. H</creator><general>Institution of Electrical Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20050804</creationdate><title>Random numbers from metastability and thermal noise</title><author>RANASINGHE, D. C ; LIM, D ; DEVADAS, S ; ABBOTT, D ; COLE, P. H</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c300t-ac23f9e3dd29c07485fe25c4ae769978bb8be3b0cfae70da255577ac287b0c8f3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Applied sciences</topic><topic>Design. Technologies. Operation analysis. Testing</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Integrated circuits</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>RANASINGHE, D. C</creatorcontrib><creatorcontrib>LIM, D</creatorcontrib><creatorcontrib>DEVADAS, S</creatorcontrib><creatorcontrib>ABBOTT, D</creatorcontrib><creatorcontrib>COLE, P. H</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><jtitle>Electronics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>RANASINGHE, D. C</au><au>LIM, D</au><au>DEVADAS, S</au><au>ABBOTT, D</au><au>COLE, P. H</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Random numbers from metastability and thermal noise</atitle><jtitle>Electronics letters</jtitle><date>2005-08-04</date><risdate>2005</risdate><volume>41</volume><issue>16</issue><spage>891</spage><epage>893</epage><pages>891-893</pages><issn>0013-5194</issn><eissn>1350-911X</eissn><coden>ELLEAK</coden><cop>London</cop><pub>Institution of Electrical Engineers</pub><doi>10.1049/el:20051559</doi><tpages>3</tpages><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0013-5194 |
| ispartof | Electronics letters, 2005-08, Vol.41 (16), p.891-893 |
| issn | 0013-5194 1350-911X |
| language | eng |
| recordid | cdi_crossref_primary_10_1049_el_20051559 |
| source | Alma/SFX Local Collection |
| subjects | Applied sciences Design. Technologies. Operation analysis. Testing Electronics Exact sciences and technology Integrated circuits Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices |
| title | Random numbers from metastability and thermal noise |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-11T20%3A39%3A23IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Random%20numbers%20from%20metastability%20and%20thermal%20noise&rft.jtitle=Electronics%20letters&rft.au=RANASINGHE,%20D.%20C&rft.date=2005-08-04&rft.volume=41&rft.issue=16&rft.spage=891&rft.epage=893&rft.pages=891-893&rft.issn=0013-5194&rft.eissn=1350-911X&rft.coden=ELLEAK&rft_id=info:doi/10.1049/el:20051559&rft_dat=%3Cpascalfrancis_cross%3E17017075%3C/pascalfrancis_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |