Two-dimensional InTeClO 3 : an ultrawide-bandgap material with potential application in a deep ultraviolet photodetector

Ultrawide-bandgap semiconductors, possessing bandgaps distinctly larger than the 3.4 eV of GaN, have emerged as a promising class capable of achieving deep ultraviolet (UV) light detection. Based on first-principles calculations, we propose an unexplored two-dimensional (2D) InTeClO 3 layered system...

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Veröffentlicht in:Physical chemistry chemical physics : PCCP 2023-11, Vol.25 (42), p.29241-29248
Hauptverfasser: Yu, Meiyang, Zhang, Fumin, Gao, Wenjiang, Shen, Huimin, Kang, Lili, Ju, Lin, Yin, Huabing
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Sprache:eng
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Zusammenfassung:Ultrawide-bandgap semiconductors, possessing bandgaps distinctly larger than the 3.4 eV of GaN, have emerged as a promising class capable of achieving deep ultraviolet (UV) light detection. Based on first-principles calculations, we propose an unexplored two-dimensional (2D) InTeClO 3 layered system with ultrawide bandgaps ranging from 4.34 eV of bulk to 4.54 eV of monolayer. Our calculations demonstrate that 2D InTeClO 3 monolayer can be exfoliated from its bulk counterpart and maintain good thermal and dynamic stability at room temperature. The ultrawide bandgaps may be modulated by the small in-plane strains and layer thickness in a certain range. Furthermore, the 2D InTeClO 3 monolayer shows promising electron transport behavior and strong optical absorption capacity in the deep UV range. A two-probe InTeClO 3 -based photodetection device has been constructed for evaluating the photocurrent. Remarkably, the effective photocurrent (5.7 A m −2 at photon energy of 4.2 eV) generation under polarized light has been observed in such a photodetector. Our results indicate that 2D InTeClO 3 systems have strong photoresponse capacity in the deep UV region, accompanying the remarkable polarization sensitivity and high extinction ratio. These distinctive characteristics highlight the promising application prospects of InTeClO 3 materials in the field of deep UV optoelectronics.
ISSN:1463-9076
1463-9084
DOI:10.1039/D3CP03612J