Abnormal diffusion behaviors of Cu atoms in van der Waals layered material MoS 2

We investigated the diffusion properties of metal atoms in van der Waals layered materials using first-principles calculations combined with group theory analysis. We found that there is an abnormal diffusion behavior of Cu in MoS 2 , which originated from the competition of the electronic and strai...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of materials chemistry. C, Materials for optical and electronic devices Materials for optical and electronic devices, 2019-05, Vol.7 (20), p.6052-6058
Hauptverfasser: Zhang, Cai-Xin, Li, Qianze, Tang, Li-Ming, Yang, Kaike, Xiao, Jin, Chen, Ke-Qiu, Deng, Hui-Xiong
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:We investigated the diffusion properties of metal atoms in van der Waals layered materials using first-principles calculations combined with group theory analysis. We found that there is an abnormal diffusion behavior of Cu in MoS 2 , which originated from the competition of the electronic and strain energies. Although the atom diffusing in bulk MoS 2 constantly changes the symmetry of the system with reduced electronic energy due to p–d coupling between occupied Cu d and unoccupied anion p states, the strain energy is dominant. As a result, the energy barrier of metal atoms is mainly determined by their size, making the diffusion rate of Cu faster than those of other metal atoms. Nevertheless, in the monolayer MoS 2 , the strain energy is negligible and the electronic coupling is significant, so that the strong d–d coupling between occupied Cu d and unoccupied cation d states leads to the highest diffusion barrier of Cu atoms.
ISSN:2050-7526
2050-7534
DOI:10.1039/C9TC01626K