Effects of the radio-frequency sputtering power of an MgO tunneling barrier on the tunneling magneto-resistance ratio for Co 2 Fe 6 B 2 /MgO-based perpendicular-magnetic tunnel junctions

For Co 2 Fe 6 B 2 –MgO based p-MTJ spin valves with [Co/Pt] n –SyAF layers ex situ annealed at 350 °C and 30 kOe for 30 min, the tunneling magneto-resistance (TMR) ratio strongly depended on the radio-frequency (RF) sputtering power in a 0.65–1.15 nm thick MgO tunneling barrier, achieving a TMR rati...

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Veröffentlicht in:Journal of materials chemistry. C, Materials for optical and electronic devices Materials for optical and electronic devices, 2016, Vol.4 (1), p.135-141
Hauptverfasser: Lee, Du-Yeong, Seo, Hyung-Tak, Park, Jea-Gun
Format: Artikel
Sprache:eng
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Zusammenfassung:For Co 2 Fe 6 B 2 –MgO based p-MTJ spin valves with [Co/Pt] n –SyAF layers ex situ annealed at 350 °C and 30 kOe for 30 min, the tunneling magneto-resistance (TMR) ratio strongly depended on the radio-frequency (RF) sputtering power in a 0.65–1.15 nm thick MgO tunneling barrier, achieving a TMR ratio of 168% at 300 W. The TMR ratio rapidly and linearly increased with a decrease in the RF sputtering power between 300 and 500 W and then abruptly decreased at 250 W since the face-centered-cubic crystallinity of the tunneling barrier improved with a decrease in the RF sputtering power between 300 and 500 W and then abruptly degraded at 250 W. Optical properties measured by spectroscopic ellipsometry, such as the defect state density and energy band gap of a ∼1.0 nm thick tunneling barrier layer, indicate that the RF sputtering power needed to obtain a larger poly grain size for the barrier tends to enhance the barrier's face-centered-cubic crystallinity.
ISSN:2050-7526
2050-7534
DOI:10.1039/C5TC03669K