Piezoelectric Coefficient Measurements in Ferroelectric Single Crystals Using High Voltage Atomic Force Microscopy

We report on the use of high voltage atomic force microscopy for direct measurements of the piezoelectric coefficient d 33 of monodomain RbTiOPO4 ferroelectric crystal. The measurements are compared with the conventional ac voltage modulation atomic force microscopy based technique, which needs cali...

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Veröffentlicht in:	Nano letters 2003-02, Vol.3 (2), p.169-171
Hauptverfasser:	Agronin, Alex G, Rosenwaks, Yossi, Rosenman, Gil I
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Dielectrics, piezoelectrics, and ferroelectrics and their properties Exact sciences and technology Physics Piezoelectric and electrostrictive constants Piezoelectricity and electromechanical effects
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Beschreibung
Zusammenfassung:	We report on the use of high voltage atomic force microscopy for direct measurements of the piezoelectric coefficient d 33 of monodomain RbTiOPO4 ferroelectric crystal. The measurements are compared with the conventional ac voltage modulation atomic force microscopy based technique, which needs calibration of the measurement apparatus. The comparison of the two measurement methods with literature reported values is discussed.
ISSN:	1530-6984 1530-6992
DOI:	10.1021/nl0258933