A Study of the Equilibrium Surface Tension and the Critical Micelle Concentration of Mixed Surfactant Solutions
The existence of a minimum in the surface tension (γ)−concentration (C) curve of surfactant solutions is investigated. Equilibrium surface tension and solution conductivity (κ) of anionic surfactant (SDS) solution and mixed anionic−nonionic surfactant (SDS−NP(EO)40) solutions are measured. Minima ar...
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Veröffentlicht in: | Langmuir 1999-06, Vol.15 (13), p.4370-4376 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The existence of a minimum in the surface tension (γ)−concentration (C) curve of surfactant solutions is investigated. Equilibrium surface tension and solution conductivity (κ) of anionic surfactant (SDS) solution and mixed anionic−nonionic surfactant (SDS−NP(EO)40) solutions are measured. Minima are observed in the γ−log C curves. The critical micelle concentration (CMC) inferred from the κ−C data does not match the bulk concentration at which the minimum in the γ−log C curve occurs, but corresponds to the one at which surface tension reaches the constant equilibrium value. Polyoxyethylene nonionic surfactants C m E n are mixed and solutions show no minimum in the γ−log C curves, whereas minima in γ−log C curves for solutions of C10E8 and C12E8 mixing with a trace of n-dodecanol are observed. Therefore, the existence of a minimum or a negative peak in the γ−log C profile may imply that the surfactant is a mixture, but no negative peak in the γ−log C profile does not imply that there is no impurity in the surfactant or the surfactant consists of only one component. A clear break with no negative peak in the γ−log C profile may be a better criteria for surfactant purity, but is still not a guarantee. |
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ISSN: | 0743-7463 1520-5827 |
DOI: | 10.1021/la981149f |