Spark-Gap Atomic Emission Microscopy
A new technique allowing elemental analysis of small regions of scanning tunneling microscopy (STM) substrates without loss of tip-surface registry has been developed. The technique is based on spark atomic emission spectroscopy and provides information normally unavailable from the STM. In this tec...
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Veröffentlicht in: | Journal of physical chemistry (1952) 1996-02, Vol.100 (9), p.3646-3651 |
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Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | A new technique allowing elemental analysis of small regions of scanning tunneling microscopy (STM) substrates without loss of tip-surface registry has been developed. The technique is based on spark atomic emission spectroscopy and provides information normally unavailable from the STM. In this technique, a voltage excursion (>100 V) is used to excite the sample and cause emission. Spectra from a polished copper electrode surface are presented and discussed. Important parameters and present limitations are also discussed along with future directions for the improvement and long-term use of the technique. |
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ISSN: | 0022-3654 1541-5740 |
DOI: | 10.1021/jp951540z |