Characterization of Thermally Reduced Graphene Oxide by Imaging Ellipsometry

The dispersion functions for the refractive index and the extinction coefficient of single- and multiple-layer graphene oxide samples were measured by imaging spectroscopic ellipsometry in the wavelength range of 350−1000 nm and were compared to previously reported results measured by confocal micro...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of physical chemistry. C 2008-06, Vol.112 (23), p.8499-8506
Hauptverfasser: Jung, Inhwa, Vaupel, Matthias, Pelton, Matthew, Piner, Richard, Dikin, Dmitriy A, Stankovich, Sasha, An, Jinho, Ruoff, Rodney S
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The dispersion functions for the refractive index and the extinction coefficient of single- and multiple-layer graphene oxide samples were measured by imaging spectroscopic ellipsometry in the wavelength range of 350−1000 nm and were compared to previously reported results measured by confocal microscopy. The dispersion functions for thin platelets were also compared to those obtained by standard spectroscopic ellipsometry on a deposit consisting of many overlapping graphene oxide layers. Changes were observed in both the thickness of the deposits and the values of the dispersion parameters following heating. A model is proposed to explain these observations, based on the removal of water between the graphene-oxide layers upon thermal treatment.
ISSN:1932-7447
1932-7455
DOI:10.1021/jp802173m