A Quantitative Structural Investigation of the 0.1 wt % Nb-SrTiO 3 (001)/H 2 O Interface
Surface X-ray diffraction has been employed to elucidate the structure of the interface between a well-characterized (001) surface of 0.1 wt % Nb-SrTiO and liquid H O. Results are reported for the clean surface, the surface in contact with a drop of liquid water, and the surface after the water drop...
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Veröffentlicht in: | Journal of physical chemistry. C 2014-05, Vol.118 (20), p.10980-10988 |
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Hauptverfasser: | , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Surface X-ray diffraction has been employed to elucidate the structure of the interface between a well-characterized (001) surface of 0.1 wt % Nb-SrTiO
and liquid H
O. Results are reported for the clean surface, the surface in contact with a drop of liquid water, and the surface after the water droplet has been removed with a flow of nitrogen. The investigation revealed that the clean surface, prepared via annealing in 1 × 10
mbar O
partial pressure, is unreconstructed and rough on a short length scale. The surface is covered with large terraces, the topmost layer of which is either TiO
or SrO with an area ratio of about 7/3. For the surface in contact with water, our results reveal that associative H
O adsorption is favored for the TiO
-terminated terrace whereas adsorption is dissociative for the SrO-terminated terrace, which validates recent first-principles calculations. After removal of the water droplet, the surface largely resembles the water-covered surface but now with a disordered overlayer of water present on the surface. |
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ISSN: | 1932-7447 1932-7455 |
DOI: | 10.1021/jp5034118 |