A Quantitative Structural Investigation of the 0.1 wt % Nb-SrTiO 3 (001)/H 2 O Interface

Surface X-ray diffraction has been employed to elucidate the structure of the interface between a well-characterized (001) surface of 0.1 wt % Nb-SrTiO and liquid H O. Results are reported for the clean surface, the surface in contact with a drop of liquid water, and the surface after the water drop...

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Veröffentlicht in:Journal of physical chemistry. C 2014-05, Vol.118 (20), p.10980-10988
Hauptverfasser: Hussain, H, Torrelles, X, Rajput, P, Nicotra, M, Thornton, G, Zegenhagen, J
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Sprache:eng
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Zusammenfassung:Surface X-ray diffraction has been employed to elucidate the structure of the interface between a well-characterized (001) surface of 0.1 wt % Nb-SrTiO and liquid H O. Results are reported for the clean surface, the surface in contact with a drop of liquid water, and the surface after the water droplet has been removed with a flow of nitrogen. The investigation revealed that the clean surface, prepared via annealing in 1 × 10 mbar O partial pressure, is unreconstructed and rough on a short length scale. The surface is covered with large terraces, the topmost layer of which is either TiO or SrO with an area ratio of about 7/3. For the surface in contact with water, our results reveal that associative H O adsorption is favored for the TiO -terminated terrace whereas adsorption is dissociative for the SrO-terminated terrace, which validates recent first-principles calculations. After removal of the water droplet, the surface largely resembles the water-covered surface but now with a disordered overlayer of water present on the surface.
ISSN:1932-7447
1932-7455
DOI:10.1021/jp5034118