Atomic Arrangement in Two-Dimensional Silica: From Crystalline to Vitreous Structures

The atomic structure of vitreous and crystalline regions of a thin silica film on Ru(0001) was investigated using noncontact atomic force microscopy (nc-AFM) and scanning tunneling microscopy (STM). We were able to resolve the atomic arrangement of the Si and the O atoms in the crystalline and the v...

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Veröffentlicht in:	Journal of physical chemistry. C 2012-09, Vol.116 (38), p.20426-20432
Hauptverfasser:	Lichtenstein, Leonid, Heyde, Markus, Freund, Hans-Joachim
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Nanoscale materials: clusters, nanoparticles, nanotubes, and nanocrystals Physics Solid surfaces and solid-solid interfaces Structure and morphology thickness Structure of solids and liquids crystallography Surface structure and topography Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology
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Beschreibung
Zusammenfassung:	The atomic structure of vitreous and crystalline regions of a thin silica film on Ru(0001) was investigated using noncontact atomic force microscopy (nc-AFM) and scanning tunneling microscopy (STM). We were able to resolve the atomic arrangement of the Si and the O atoms in the crystalline and the vitreous structures. We discuss characteristic structural properties of the films, such as distances, orientations, and angles, and we compare our results to experiments and simulations of bulk vitreous silica networks. It was found that order in two-dimensional vitreous networks can extend up to 2 nm.
ISSN:	1932-7447 1932-7455
DOI:	10.1021/jp3062866