Is there any beam yet? Uses of synchrotron radiation in the in situ study of electrochemical interfaces

The advantages of employing synchrotron radiation for the in situ study of electrochemical interfaces are discussed with emphasis on the techniques of surface EXAFS (extended X-ray absorption fine structure) and X-ray standing waves. The principles behind the techniques are briefly considered follow...

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Veröffentlicht in:J. Phys. Chem.; (United States) 1988-12, Vol.92 (25), p.7045-7052
Hauptverfasser: Abruna, H. D, White, J. H, Albarelli, M. J, Bommarito, G. M, Bedzyk, M. J, McMillan, M
Format: Artikel
Sprache:eng
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Zusammenfassung:The advantages of employing synchrotron radiation for the in situ study of electrochemical interfaces are discussed with emphasis on the techniques of surface EXAFS (extended X-ray absorption fine structure) and X-ray standing waves. The principles behind the techniques are briefly considered followed by a discussion of recent experimental results. Examples include the study of under potentially deposited metallic monolayers, polymer films on electrodes, and in situ measurement of adsorption isotherms. The authors conclude with an assessment of future directions.
ISSN:0022-3654
1541-5740
DOI:10.1021/j100336a005