$A Multitechnique Approach for Materials Characterization: Using X-Ray Diffractometry, Visible Spectroscopy, and Atomic Absorption Analysis to Determine Thin Metal Film Thickness$

A Multitechnique Approach for Materials Characterization: Using X-Ray Diffractometry, Visible Spectroscopy, and Atomic Absorption Analysis to Determine Thin Metal Film Thickness

Procedure using X-Ray diffractometry, visible spectroscopy, and atomic absorption analysis to determine thin metal film thickness.

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Bibliographische Detailangaben
Veröffentlicht in:	Journal of chemical education 1994-10, Vol.71 (10), p.892
1. Verfasser:	D'Agostino, Alfred T
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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Beschreibung
Zusammenfassung:	Procedure using X-Ray diffractometry, visible spectroscopy, and atomic absorption analysis to determine thin metal film thickness.
ISSN:	0021-9584 1938-1328
DOI:	10.1021/ed071p892