A Novel Batch Cooling Crystallizer for in Situ Monitoring of Solution Crystallization Using Energy Dispersive X-ray Diffraction

In situ X-ray diffraction monitoring of crystallization from solution is often hampered by a combination of the rather low levels of crystallized solid (typically 5 to 20 wt %) and the large background scattering that arises from the solution phase. In this work, we have attempted to overcome these...

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Veröffentlicht in:Crystal growth & design 2003-03, Vol.3 (2), p.197-201
Hauptverfasser: Blagden, Nicholas, Davey, Roger, Song, Mike, Quayle, Mike, Clark, Simon, Taylor, David, Nield, Alfie
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Sprache:eng
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