Near-Field Radiative Heat Transfer between Dissimilar Materials Mediated by Coupled Surface Phonon- and Plasmon-Polaritons
Near-field radiative heat transfer (NFRHT) between dissimilar materials supporting surface polaritons in the infrared is of critical importance for applications such as photonic thermal rectification and near-field thermophotovoltaics. Here, we measure NFRHT between millimeter-size surfaces made of...
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Veröffentlicht in: | ACS photonics 2020-05, Vol.7 (5), p.1304-1311 |
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Sprache: | eng |
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Zusammenfassung: | Near-field radiative heat transfer (NFRHT) between dissimilar materials supporting surface polaritons in the infrared is of critical importance for applications such as photonic thermal rectification and near-field thermophotovoltaics. Here, we measure NFRHT between millimeter-size surfaces made of 6H-SiC and doped Si, respectively, supporting surface phonon-polaritons (SPhPs) and surface plasmon-polaritons (SPPs) in the infrared, separated by a 150 nm thick vacuum gap spacing maintained via SiO2 nanopillars. For the purpose of comparison, measurements are also performed between two doped Si surfaces. The measured radiative flux is in good agreement with theoretical predictions based on fluctuational electrodynamics. A flux enhancement beyond the blackbody limit of ∼8.2 is obtained for the SiC-Si sample, which is smaller than the enhancement for the Si–Si sample (∼12.5), owing to the spectral mismatch of the SiC and Si light lines and SPhP and SPP resonances. However, due to lower losses in SiC than Si and weaker SPhP–SPP coupling than SPP coupling, the near-field enhancement for the SiC-Si sample exhibits a more pronounced monochromatic behavior, with a resonant flux that is ∼5× larger than the resonant flux for the Si–Si sample. This work demonstrates that it is possible to modulate NFRHT via surface polariton coupling and will accelerate the development of energy conversion and thermal management devices capitalizing on the near-field effects of thermal radiation between dissimilar materials. |
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ISSN: | 2330-4022 2330-4022 |
DOI: | 10.1021/acsphotonics.0c00404 |