Line and Point Defects in MoSe 2 Bilayer Studied by Scanning Tunneling Microscopy and Spectroscopy

Line and Point Defects in MoSe 2 Bilayer Studied by Scanning Tunneling Microscopy and Spectroscopy

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Veröffentlicht in:ACS nano 2015-06, Vol.9 (6), p.6619-6625
Hauptverfasser: Liu, Hongjun, Zheng, Hao, Yang, Fang, Jiao, Lu, Chen, Jinglei, Ho, Wingkin, Gao, Chunlei, Jia, Jinfeng, Xie, Maohai
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container_end_page 6625
container_issue 6
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container_title ACS nano
container_volume 9
creator Liu, Hongjun
Zheng, Hao
Yang, Fang
Jiao, Lu
Chen, Jinglei
Ho, Wingkin
Gao, Chunlei
Jia, Jinfeng
Xie, Maohai
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doi_str_mv 10.1021/acsnano.5b02789
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title Line and Point Defects in MoSe 2 Bilayer Studied by Scanning Tunneling Microscopy and Spectroscopy
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