Precursor-Confined Chemical Vapor Deposition of 2D Single-Crystalline Se x Te 1- x Nanosheets for p-Type Transistors and Inverters
Two-dimensional (2D) tellurium (Te) is emerging as a promising p-type candidate for constructing complementary metal-oxide-semiconductor (CMOS) architectures. However, its small bandgap leads to a high leakage current and a low on/off current ratio. Although alloying Te with selenium (Se) can tune i...
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Veröffentlicht in: | ACS nano 2024-07, Vol.18 (26), p.17293-17303 |
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Hauptverfasser: | , , , , , , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Two-dimensional (2D) tellurium (Te) is emerging as a promising p-type candidate for constructing complementary metal-oxide-semiconductor (CMOS) architectures. However, its small bandgap leads to a high leakage current and a low on/off current ratio. Although alloying Te with selenium (Se) can tune its bandgap, thermally evaporated Se
Te
thin films often suffer from grain boundaries and high-density defects. Herein, we introduce a precursor-confined chemical vapor deposition (CVD) method for synthesizing single-crystalline Se
Te
alloy nanosheets. These nanosheets, with tunable compositions, are ideal for high-performance field-effect transistors (FETs) and 2D inverters. The preformation of Se-Te frameworks in our developed CVD method plays a critical role in the growth of Se
Te
nanosheets with high crystallinity. Optimizing the Se composition resulted in a Se
Te
nanosheet-based p-type FET with a large on/off current ratio of 4 × 10
and a room-temperature hole mobility of 120 cm
·V
·s
, being eight times higher than thermally evaporated Se
Te
with similar composition and thickness. Moreover, we successfully fabricated an inverter based on p-type Se
Te
and n-type MoS
nanosheets, demonstrating a typical voltage transfer curve with a gain of 30 at an operation voltage of
= 3 V. |
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ISSN: | 1936-0851 1936-086X |
DOI: | 10.1021/acsnano.4c05323 |