Precursor-Confined Chemical Vapor Deposition of 2D Single-Crystalline Se x Te 1- x Nanosheets for p-Type Transistors and Inverters

Two-dimensional (2D) tellurium (Te) is emerging as a promising p-type candidate for constructing complementary metal-oxide-semiconductor (CMOS) architectures. However, its small bandgap leads to a high leakage current and a low on/off current ratio. Although alloying Te with selenium (Se) can tune i...

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Veröffentlicht in:ACS nano 2024-07, Vol.18 (26), p.17293-17303
Hauptverfasser: Huang, Haoxin, Zha, Jiajia, Xu, Songcen, Yang, Peng, Xia, Yunpeng, Wang, Huide, Dong, Dechen, Zheng, Long, Yao, Yao, Zhang, Yuxuan, Chen, Ye, Ho, Johnny C, Chan, Hau Ping, Zhao, Chunsong, Tan, Chaoliang
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Sprache:eng
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Zusammenfassung:Two-dimensional (2D) tellurium (Te) is emerging as a promising p-type candidate for constructing complementary metal-oxide-semiconductor (CMOS) architectures. However, its small bandgap leads to a high leakage current and a low on/off current ratio. Although alloying Te with selenium (Se) can tune its bandgap, thermally evaporated Se Te thin films often suffer from grain boundaries and high-density defects. Herein, we introduce a precursor-confined chemical vapor deposition (CVD) method for synthesizing single-crystalline Se Te alloy nanosheets. These nanosheets, with tunable compositions, are ideal for high-performance field-effect transistors (FETs) and 2D inverters. The preformation of Se-Te frameworks in our developed CVD method plays a critical role in the growth of Se Te nanosheets with high crystallinity. Optimizing the Se composition resulted in a Se Te nanosheet-based p-type FET with a large on/off current ratio of 4 × 10 and a room-temperature hole mobility of 120 cm ·V ·s , being eight times higher than thermally evaporated Se Te with similar composition and thickness. Moreover, we successfully fabricated an inverter based on p-type Se Te and n-type MoS nanosheets, demonstrating a typical voltage transfer curve with a gain of 30 at an operation voltage of = 3 V.
ISSN:1936-0851
1936-086X
DOI:10.1021/acsnano.4c05323