High DC-Bias Stability and Reliability in BaTiO 3 -Based Multilayer Ceramic Capacitors: The Role of the Core-Shell Structure and the Electrode

With the miniaturization of multilayer ceramic capacitors (MLCCs) and the increase of the electric field on a single dielectric layer, dielectric constant DC-bias stability and reliability have gradually aroused attention in the advanced electronics industry. In this study, MLCCs with outstanding DC...

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Veröffentlicht in:ACS applied materials & interfaces 2024-01, Vol.16 (1), p.1158-1169
Hauptverfasser: Zhang, Weichen, Jiang, Ying, Xiao, Mengjian, Zhen, Yichao, Zhu, Chaoqiong, Zhao, Peiyao, Hui, Kezhen, Guo, Limin, Cheng, Xu, Fu, Zhenxiao, Cao, Xiuhua, Wang, Xiaohui
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Sprache:eng
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Zusammenfassung:With the miniaturization of multilayer ceramic capacitors (MLCCs) and the increase of the electric field on a single dielectric layer, dielectric constant DC-bias stability and reliability have gradually aroused attention in the advanced electronics industry. In this study, MLCCs with outstanding DC-bias stability and reliability were prepared by using dielectric ceramic optimization and electrode optimization strategies. The effect of the Dy-Y doping concentration on the microstructure, dielectric properties, and reliability of BaTiO -based ceramics was investigated. The shell ratio and effective shell doping concentration of the core-shell structure in ceramic grains play important roles in defects and electrical performances. The ceramic with appropriate doping contents shows a dielectric constant of 1800 and a dielectric constant change rate of -17% under a DC field of 4 kV/mm, which was fabricated into prototype MLCCs with different Ni electrodes. MLCCs exhibit outstanding DC-bias stability with a -28% degradation in the dielectric constant under a DC field of 4 kV/mm while possessing a dielectric constant of 2300 and satisfying the EIA X7S specification. Additionally, it was discovered that MLCCs prepared by using fine-size Ni particle electrodes have low electrode roughness and high interfacial Schottky barriers, resulting in better reliability. This study provides promising candidate materials and theoretical references for high-end and high DC-bias stability MLCCs.
ISSN:1944-8244
1944-8252
DOI:10.1021/acsami.3c16740