Contact Engineering Using Manganese, Chromium, and Bathocuproine in Group 14 Phthalocyanine Organic Thin-Film Transistors
Silicon and tin(IV) phthalocyanines, which have been demonstrated as simple-to-synthesize materials for n-type organic thin-film transistors (OTFTs), have relatively shallow lowest unoccupied molecular orbital (LUMO) levels that create a Schottky barrier with the gold source–drain contacts typicall...
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Veröffentlicht in: | ACS applied electronic materials 2020-05, Vol.2 (5), p.1313-1322 |
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Sprache: | eng |
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Zusammenfassung: | Silicon and tin(IV) phthalocyanines, which have been demonstrated as simple-to-synthesize materials for n-type organic thin-film transistors (OTFTs), have relatively shallow lowest unoccupied molecular orbital (LUMO) levels that create a Schottky barrier with the gold source–drain contacts typically used in device fabrication. To reduce the contact resistance (R C) associated with this barrier and improve the OTFT performance, we fabricated bottom-gate top-contact (BGTC) devices using low-work-function metals (Mn/Cr) and an electron dopant material (bathocuproine, BCP) as contact interlayers. We characterized two tin phthalocyanines (SnPcs), tin bis(pentafluorophenoxy)phthalocyanine (F10-SnPc) and tin bis(2,4,6-trifluorophenoxy)phthalocyanine (246F-SnPc), as organic semiconductors (OSCs) and compared them to their silicon phthalocyanine (SiPc) analogues. We found that using Mn and Cr interlayers with SiPc OTFTs reduces R C to as low as 11.8 kΩ cm and reduces the threshold voltage (V T) to as low as 7.8 V while improving linear region characteristics compared to devices using silver or gold electrodes only. BCP interlayers appear to reduce V T in all SiPc and SnPc devices and increase the off-state conductivity of SnPc devices if covering the entire OSC. Overall, this work demonstrates the potential for metal interlayers and solid-state organic interlayers for improving electron transport in low-cost, n-type OTFTs using group 14 phthalocyanines. |
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ISSN: | 2637-6113 2637-6113 |
DOI: | 10.1021/acsaelm.0c00104 |