Spectroscopic Characterization of Fluorinated Benzylphosphonic Acid Monolayers on AlO x /Al Surfaces

We recently reported on how the surface energy and work function of AlO x /Al substrates can be tuned by self-assembled monolayers of fluorinated and nonfluorinated benzylphosphonic acid derivatives in view of organic electronic applications. In this contribution, we present a thorough investigation of these monolayers by photoemission (XPS) and infrared (PM-IRRAS) spectroscopies, to provide a quantitative understanding of their structural properties (packing density and orientation) and chemical composition. A detailed analysis of XPS chemical shifts makes an assignment of the carbon species present in the SAMs feasible, from the low-binding-energy aromatic carbon (∼284.5 eV) to the highly electronegative fluorine-substituted carbon (∼287.5 eV), whereby an upper limit for the fraction of nonspecific hydrocarbons (