Quantitative Local Conductivity Imaging of Semiconductors Using Near-Field Optical Microscopy

Quantitative Local Conductivity Imaging of Semiconductors Using Near-Field Optical Microscopy

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Veröffentlicht in:Journal of physical chemistry. C 2022-03, Vol.126 (9), p.4515-4521
Hauptverfasser: Ritchie, Earl T., Casper, Clayton B., Lee, Taehyun A., Atkin, Joanna M.
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container_end_page 4521
container_issue 9
container_start_page 4515
container_title Journal of physical chemistry. C
container_volume 126
creator Ritchie, Earl T.
Casper, Clayton B.
Lee, Taehyun A.
Atkin, Joanna M.
description
doi_str_mv 10.1021/acs.jpcc.1c10498
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title Quantitative Local Conductivity Imaging of Semiconductors Using Near-Field Optical Microscopy
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