Structural Anomalies in Binary Mixtures of Ionic Liquid [Bmim]BF 4 with Water Studied by EPR
Ionic liquids (ILs) show a variety of unusual and intriguing properties on a molecular level. Recently, a new type of structural anomaly occurring in neat ILs near their glass transition temperatures ( ) has been found. In particular, the coexistence of two types of IL environments was observed, one...
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Veröffentlicht in: | The journal of physical chemistry. B 2019-11, Vol.123 (46), p.9956-9962 |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Ionic liquids (ILs) show a variety of unusual and intriguing properties on a molecular level. Recently, a new type of structural anomaly occurring in neat ILs near their glass transition temperatures (
) has been found. In particular, the coexistence of two types of IL environments was observed, one of which progressively suppresses the molecular mobility upon temperature increase within ∼(
-60 K) and
. To clarify the nature of these anomalies, their general characteristics, and potential for applications, in this work we investigated the molecular mobility in binary mixtures of IL [Bmim]BF
with water using electron paramagnetic resonance spectroscopy and spin probes (stable nitroxides TEMPO-D
, (2,2,6,6-tetramethylpiperidin-1-yl)oxyl, and 14-carbamoyl-7-azadispiro[5.1.5.2]pentadeca-14-ene-7-oxyl). In a series of such mixtures with water content
= 0.2-50 wt %, we detected similar anomalies to those found in neat IL (
= 0). For
< 2.5 wt %, the differences in manifestations of structural anomalies are negligible compared to those in neat ILs. In the range 2.5 ≤
< 5 wt %, an abrupt partial suppression of anomaly is observed, but further increase of the water content up to
= 50 wt % has no impact on anomaly since, most plausibly, it leads only to the growth of the water-rich domains. Consequently, the observed structural anomalies are rather robust against the presence of water in ILs, which is beneficial for their potential applications. |
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ISSN: | 1520-6106 1520-5207 |
DOI: | 10.1021/acs.jpcb.9b08933 |