Polymorphism in Type-II Dirac Semimetal WSi 2 under Pressure: Structural, Mechanical, and Electronic Insights

The type-II Dirac candidate semimetal WSi is a promising candidate for electronic devices, quantum computing, and topological materials research, owing its distinct electronic structure and superior mechanical properties. Here, we synthesized high-quality WSi materials and systematically investigate...

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Veröffentlicht in:Inorganic chemistry 2024-11, Vol.63 (46), p.22227-22238
Hauptverfasser: Liang, Hao, Zeng, Yingying, Liu, Lei, Pu, Jieru, Luo, Hao, Xiong, Zhengwei, Zhang, Wei, Niu, Zhenwei, Fang, Leiming, Zou, Yongtao
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Sprache:eng
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Zusammenfassung:The type-II Dirac candidate semimetal WSi is a promising candidate for electronic devices, quantum computing, and topological materials research, owing its distinct electronic structure and superior mechanical properties. Here, we synthesized high-quality WSi materials and systematically investigated their compressive behavior, and structural and electronic properties under high pressure using in-situ high pressure experiments, complemented by first-principles calculations. The results confirms that WSi has the properties of a type-II Dirac semimetal. Our results demonstrate that WSi maintains structural stability under high pressure but undergoes an electronic phase transition from a semimetal to a metal around 40 GPa. Additionally, the mechanical hardness softens discontinuously at this pressure. The structural stability of WSi under high pressure is attributed to the strong hybridization of Si-3 and W-5 electrons, the rigid crystal lattice, and the adaptable electronic structure. The pressure-induced electronic phase transition and softening are primarily governed by the energy band reconstruction and W-5 orbitals. This study provides valuable insights into the high-pressure behavior of type-II Dirac semimetal, highlighting their potential for advanced applications in electronic devices and topological quantum computing under extreme conditions by elucidating their structural stability and electronic phase transition mechanisms.
ISSN:0020-1669
1520-510X
DOI:10.1021/acs.inorgchem.4c03850