Monitoring Amine Intercalation in H 3 Sb 3 P 2 O 14 Thin Films Based on Real-Time X-ray Diffraction Data Analysis
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| Veröffentlicht in: | Chemistry of materials 2023-02, Vol.35 (3), p.837-845 |
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| container_end_page | 845 |
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| container_issue | 3 |
| container_start_page | 837 |
| container_title | Chemistry of materials |
| container_volume | 35 |
| creator | Däntl, Marie Maschita, Johannes Wochner, Peter Jiménez-Solano, Alberto Vignolo-González, Hugo A. Putzky, Daniel Dinnebier, Robert E. Bette, Sebastian Lotsch, Bettina V. |
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| doi_str_mv | 10.1021/acs.chemmater.2c02394 |
| format | Article |
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| identifier | ISSN: 0897-4756 |
| ispartof | Chemistry of materials, 2023-02, Vol.35 (3), p.837-845 |
| issn | 0897-4756 1520-5002 |
| language | eng |
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| source | ACS Publications |
| title | Monitoring Amine Intercalation in H 3 Sb 3 P 2 O 14 Thin Films Based on Real-Time X-ray Diffraction Data Analysis |
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