Epitaxial Growth of Bis(dimethylglyoximato)platinum(II) Accompanied by Hole Formation

High-resolution transmission electron microscopy was performed to evaluate the crystallinity of bis­(dimethyl­glyoximato)­platinum­(II) (Pt­(dmg)2) grown on KCl and KBr substrates. Although the epitaxial orientations of the Pt­(dmg)2 thin films grown on the KCl and KBr substrates were nearly identical, the crystallinity of the individual crystalline domains varied. A misfit between Pt­(dmg)2 and KBr based on a point-on-line coincidence was thought to have affected the crystallinity of the deposited thin film. Some of the Pt­(dmg)2 crystals that formed on the KBr substrate contained holes due to defects. Careful selection of a substrate with a small misfit value is important for obtaining highly crystalline epitaxial thin films.