Characterization of thin-layer chromatographically separated fractions by Fourier transform infrared diffuse reflectance spectrometry
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| Veröffentlicht in: | Analytical chemistry (Washington) 1987-02, Vol.59 (3), p.415-418 |
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| Sprache: | eng |
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| container_end_page | 418 |
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| container_issue | 3 |
| container_start_page | 415 |
| container_title | Analytical chemistry (Washington) |
| container_volume | 59 |
| creator | Chalmers, John M Mackenzie, Moray W Sharp, John L Ibbett, Roger N |
| description | |
| doi_str_mv | 10.1021/ac00130a008 |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 0003-2700 |
| ispartof | Analytical chemistry (Washington), 1987-02, Vol.59 (3), p.415-418 |
| issn | 0003-2700 1520-6882 |
| language | eng |
| recordid | cdi_crossref_primary_10_1021_ac00130a008 |
| source | American Chemical Society Journals |
| subjects | Analytical chemistry Chemistry Chromatographic methods and physical methods associated with chromatography Exact sciences and technology Other chromatographic methods |
| title | Characterization of thin-layer chromatographically separated fractions by Fourier transform infrared diffuse reflectance spectrometry |
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