Low-Dose and In-Painting Methods for (Near) Atomic Resolution STEM Imaging of Metal Organic Frameworks (MOFs)
Gespeichert in:
| Veröffentlicht in: | Microscopy and microanalysis 2017-07, Vol.23 (S1), p.1804-1805 |
|---|---|
| Hauptverfasser: | , , , , , , , , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 1805 |
|---|---|
| container_issue | S1 |
| container_start_page | 1804 |
| container_title | Microscopy and microanalysis |
| container_volume | 23 |
| creator | Mehdi, B. L. Stevens, A. J. Moeck, P. Dohnalkova, A. Vjunov, A. Fulton, J. L. Camaioni, D. M. Farha, O. K. Hupp, J. T. Gates, B. C. Lercher, J. A. Browning, N. D. |
| description | |
| doi_str_mv | 10.1017/S1431927617009680 |
| format | Article |
| fullrecord | <record><control><sourceid>cambridge_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1017_S1431927617009680</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><cupid>10_1017_S1431927617009680</cupid><sourcerecordid>10_1017_S1431927617009680</sourcerecordid><originalsourceid>FETCH-LOGICAL-c1770-2968884bfd8adff650948a7d3efa3ca6b8a94312b8eb7c5415b02cca9b0df8c83</originalsourceid><addsrcrecordid>eNp9kE1PAjEQhhujiYj-AG89wmG13a92jwRBSUCM4Hkz_VoX2da0S4j_3l3lZuJpJjPzTN73ReiWkjtKKLvf0DShRcxyyggpck7O0KAbZRGnNDv_6WnU7y_RVQg7QkhCWD5AzdIdowcXNAar8MJGL1DbtrYVXun23amAjfN49KzBj_GkdU0t8asObn9oa2fxZjtb4UUDVU8400Owx2tfge0O5x4afXT-I-DRaj0P42t0YWAf9M2pDtHbfLadPkXL9eNiOllGkjJGorgzwHkqjOKgjMkzUqQcmEq0gURCLjgUnZ9YcC2YzFKaCRJLCYUgynDJkyGiv3-ldyF4bcpPXzfgv0pKyj6v8k9eHZOcGGiEr1Wly507eNvp_If6BoqYbBY</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Low-Dose and In-Painting Methods for (Near) Atomic Resolution STEM Imaging of Metal Organic Frameworks (MOFs)</title><source>Cambridge Journals</source><creator>Mehdi, B. L. ; Stevens, A. J. ; Moeck, P. ; Dohnalkova, A. ; Vjunov, A. ; Fulton, J. L. ; Camaioni, D. M. ; Farha, O. K. ; Hupp, J. T. ; Gates, B. C. ; Lercher, J. A. ; Browning, N. D.</creator><creatorcontrib>Mehdi, B. L. ; Stevens, A. J. ; Moeck, P. ; Dohnalkova, A. ; Vjunov, A. ; Fulton, J. L. ; Camaioni, D. M. ; Farha, O. K. ; Hupp, J. T. ; Gates, B. C. ; Lercher, J. A. ; Browning, N. D.</creatorcontrib><identifier>ISSN: 1431-9276</identifier><identifier>EISSN: 1435-8115</identifier><identifier>DOI: 10.1017/S1431927617009680</identifier><language>eng</language><publisher>New York, USA: Cambridge University Press</publisher><subject>Imaging and Spectroscopy of Beam Sensitive Materials ; Physical Science Symposia</subject><ispartof>Microscopy and microanalysis, 2017-07, Vol.23 (S1), p.1804-1805</ispartof><rights>Microscopy Society of America 2017</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c1770-2968884bfd8adff650948a7d3efa3ca6b8a94312b8eb7c5415b02cca9b0df8c83</citedby><cites>FETCH-LOGICAL-c1770-2968884bfd8adff650948a7d3efa3ca6b8a94312b8eb7c5415b02cca9b0df8c83</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.cambridge.org/core/product/identifier/S1431927617009680/type/journal_article$$EHTML$$P50$$Gcambridge$$H</linktohtml><link.rule.ids>164,314,780,784,27924,27925,55628</link.rule.ids></links><search><creatorcontrib>Mehdi, B. L.</creatorcontrib><creatorcontrib>Stevens, A. J.</creatorcontrib><creatorcontrib>Moeck, P.</creatorcontrib><creatorcontrib>Dohnalkova, A.</creatorcontrib><creatorcontrib>Vjunov, A.</creatorcontrib><creatorcontrib>Fulton, J. L.</creatorcontrib><creatorcontrib>Camaioni, D. M.</creatorcontrib><creatorcontrib>Farha, O. K.</creatorcontrib><creatorcontrib>Hupp, J. T.</creatorcontrib><creatorcontrib>Gates, B. C.</creatorcontrib><creatorcontrib>Lercher, J. A.</creatorcontrib><creatorcontrib>Browning, N. D.</creatorcontrib><title>Low-Dose and In-Painting Methods for (Near) Atomic Resolution STEM Imaging of Metal Organic Frameworks (MOFs)</title><title>Microscopy and microanalysis</title><addtitle>Microsc Microanal</addtitle><subject>Imaging and Spectroscopy of Beam Sensitive Materials</subject><subject>Physical Science Symposia</subject><issn>1431-9276</issn><issn>1435-8115</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><recordid>eNp9kE1PAjEQhhujiYj-AG89wmG13a92jwRBSUCM4Hkz_VoX2da0S4j_3l3lZuJpJjPzTN73ReiWkjtKKLvf0DShRcxyyggpck7O0KAbZRGnNDv_6WnU7y_RVQg7QkhCWD5AzdIdowcXNAar8MJGL1DbtrYVXun23amAjfN49KzBj_GkdU0t8asObn9oa2fxZjtb4UUDVU8400Owx2tfge0O5x4afXT-I-DRaj0P42t0YWAf9M2pDtHbfLadPkXL9eNiOllGkjJGorgzwHkqjOKgjMkzUqQcmEq0gURCLjgUnZ9YcC2YzFKaCRJLCYUgynDJkyGiv3-ldyF4bcpPXzfgv0pKyj6v8k9eHZOcGGiEr1Wly507eNvp_If6BoqYbBY</recordid><startdate>201707</startdate><enddate>201707</enddate><creator>Mehdi, B. L.</creator><creator>Stevens, A. J.</creator><creator>Moeck, P.</creator><creator>Dohnalkova, A.</creator><creator>Vjunov, A.</creator><creator>Fulton, J. L.</creator><creator>Camaioni, D. M.</creator><creator>Farha, O. K.</creator><creator>Hupp, J. T.</creator><creator>Gates, B. C.</creator><creator>Lercher, J. A.</creator><creator>Browning, N. D.</creator><general>Cambridge University Press</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>201707</creationdate><title>Low-Dose and In-Painting Methods for (Near) Atomic Resolution STEM Imaging of Metal Organic Frameworks (MOFs)</title><author>Mehdi, B. L. ; Stevens, A. J. ; Moeck, P. ; Dohnalkova, A. ; Vjunov, A. ; Fulton, J. L. ; Camaioni, D. M. ; Farha, O. K. ; Hupp, J. T. ; Gates, B. C. ; Lercher, J. A. ; Browning, N. D.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1770-2968884bfd8adff650948a7d3efa3ca6b8a94312b8eb7c5415b02cca9b0df8c83</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Imaging and Spectroscopy of Beam Sensitive Materials</topic><topic>Physical Science Symposia</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Mehdi, B. L.</creatorcontrib><creatorcontrib>Stevens, A. J.</creatorcontrib><creatorcontrib>Moeck, P.</creatorcontrib><creatorcontrib>Dohnalkova, A.</creatorcontrib><creatorcontrib>Vjunov, A.</creatorcontrib><creatorcontrib>Fulton, J. L.</creatorcontrib><creatorcontrib>Camaioni, D. M.</creatorcontrib><creatorcontrib>Farha, O. K.</creatorcontrib><creatorcontrib>Hupp, J. T.</creatorcontrib><creatorcontrib>Gates, B. C.</creatorcontrib><creatorcontrib>Lercher, J. A.</creatorcontrib><creatorcontrib>Browning, N. D.</creatorcontrib><collection>CrossRef</collection><jtitle>Microscopy and microanalysis</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Mehdi, B. L.</au><au>Stevens, A. J.</au><au>Moeck, P.</au><au>Dohnalkova, A.</au><au>Vjunov, A.</au><au>Fulton, J. L.</au><au>Camaioni, D. M.</au><au>Farha, O. K.</au><au>Hupp, J. T.</au><au>Gates, B. C.</au><au>Lercher, J. A.</au><au>Browning, N. D.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Low-Dose and In-Painting Methods for (Near) Atomic Resolution STEM Imaging of Metal Organic Frameworks (MOFs)</atitle><jtitle>Microscopy and microanalysis</jtitle><addtitle>Microsc Microanal</addtitle><date>2017-07</date><risdate>2017</risdate><volume>23</volume><issue>S1</issue><spage>1804</spage><epage>1805</epage><pages>1804-1805</pages><issn>1431-9276</issn><eissn>1435-8115</eissn><cop>New York, USA</cop><pub>Cambridge University Press</pub><doi>10.1017/S1431927617009680</doi><tpages>2</tpages><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 1431-9276 |
| ispartof | Microscopy and microanalysis, 2017-07, Vol.23 (S1), p.1804-1805 |
| issn | 1431-9276 1435-8115 |
| language | eng |
| recordid | cdi_crossref_primary_10_1017_S1431927617009680 |
| source | Cambridge Journals |
| subjects | Imaging and Spectroscopy of Beam Sensitive Materials Physical Science Symposia |
| title | Low-Dose and In-Painting Methods for (Near) Atomic Resolution STEM Imaging of Metal Organic Frameworks (MOFs) |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-05T09%3A06%3A47IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-cambridge_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Low-Dose%20and%20In-Painting%20Methods%20for%20(Near)%20Atomic%20Resolution%20STEM%20Imaging%20of%20Metal%20Organic%20Frameworks%20(MOFs)&rft.jtitle=Microscopy%20and%20microanalysis&rft.au=Mehdi,%20B.%20L.&rft.date=2017-07&rft.volume=23&rft.issue=S1&rft.spage=1804&rft.epage=1805&rft.pages=1804-1805&rft.issn=1431-9276&rft.eissn=1435-8115&rft_id=info:doi/10.1017/S1431927617009680&rft_dat=%3Ccambridge_cross%3E10_1017_S1431927617009680%3C/cambridge_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_cupid=10_1017_S1431927617009680&rfr_iscdi=true |