Going Deeper in Cryo Electron Tomography with Neural Networks

Going Deeper in Cryo Electron Tomography with Neural Networks

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Veröffentlicht in:Microscopy and microanalysis 2017-07, Vol.23 (S1), p.814-815
Hauptverfasser: Chen, Muyuan, Dai, Wei, Sun, Stella Y., Schmid, Michael F., Chiu, Wah, Ludtke, Steven J.
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Analytical and Instrumentation Science Symposia
Pushing the Limits of Cryo-TEM: Development and Applications
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container_end_page 815
container_issue S1
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container_title Microscopy and microanalysis
container_volume 23
creator Chen, Muyuan
Dai, Wei
Sun, Stella Y.
Schmid, Michael F.
Chiu, Wah
Ludtke, Steven J.
description
doi_str_mv 10.1017/S1431927617004731
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subjects Analytical and Instrumentation Science Symposia
Pushing the Limits of Cryo-TEM: Development and Applications
title Going Deeper in Cryo Electron Tomography with Neural Networks
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