High-power impulse magnetron sputter deposition of TiBx thin films: Effects of pulse length and peak current density

We report on a systematic study of the effect of pulse length (ton=25−200μs), and peak target current density (JT,peak=0.25−2.0A/cm2) during HiPIMS deposition of AlB2-phase TiBx thin films from a TiB2 target at a pressure of pAr=1.33Pa(10mTorr) and substrate temperature Ts=500°C. All films are under...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Vacuum 2024-04, Vol.222, p.113070, Article 113070
Hauptverfasser: Hellgren, Niklas, Zhirkov, Igor, Sortica, Mauricio A., Petruhins, Andrejs, Greczynski, Grzegorz, Hultman, Lars, Rosen, Johanna
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:We report on a systematic study of the effect of pulse length (ton=25−200μs), and peak target current density (JT,peak=0.25−2.0A/cm2) during HiPIMS deposition of AlB2-phase TiBx thin films from a TiB2 target at a pressure of pAr=1.33Pa(10mTorr) and substrate temperature Ts=500°C. All films are under-stoichiometric with B/Ti = 1.36–1.89, with the higher values corresponding to longer pulses and higher JT,peak values. While the deposition flux, including both ions and neutrals, in general increases with increasing ton and JT,peak, the Ti+ ion flux saturates, resulting in the higher B/Ti values under these conditions. Thus, the relative amount of Ti ionization, and the degree to which these ions are guided toward the substrate by magnetic fields, are main modulators determining the composition of TiBx thin films. •Pulse length and peak current density affect HiPIMS discharge characteristics.•HiPIMS-grown TiBx films tend to be under-stoichiometric (Ti-rich).•Longer pulses and higher peak current densities result in less under-stoichiometry.•The composition can be explained by the degree of ionization, magnetic field configuration, and gas-phase scattering.
ISSN:0042-207X
1879-2715
DOI:10.1016/j.vacuum.2024.113070