Formation and properties of mixed copper sulfide (CuxS) layers on polypropylene

The sorption-diffusion method was used to obtain nonstoichiometric copper sulfide layers on polypropylene. Copper sulfide layers consisted of monoclinic structures chalcocite Cu2S and djurleite Cu1.8S. This multiphase composition of obtained thin layers was confirmed by X-ray diffraction spectroscopy. The surface morphology of layers was studied by SEM micrographs and the surface roughness was calculated from AFM data. The value for the direct bandgap for the CuxS thin layers approximately equals 2.53 eV. The changes in mechanical properties (tensile strength analysis) of polypropylene films through the CuxS layer deposition process were investigated.