A unified explicit charge-based capacitance model for metal oxide thin-film transistors

•The model offers a unified and explicit expression across all working regions of the MO TFTs.•The model takes into account the non-reciprocity of capacitance, ensuring charge conservation at all ports.•Based on the fabricated IZO TFTs, comprehensive and sufficient experimental data on capacitance w...

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Veröffentlicht in:Solid-state electronics 2024-09, Vol.219, p.108976, Article 108976
Hauptverfasser: Li, Fei-fan, Li, Hao-yang, Zhou, Zhao-hua, Zhou, Lei, Deng, Wan-ling, Xu, Miao, Wang, Lei, Wu, Wei-jing, Peng, Jun-biao
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Sprache:eng
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Zusammenfassung:•The model offers a unified and explicit expression across all working regions of the MO TFTs.•The model takes into account the non-reciprocity of capacitance, ensuring charge conservation at all ports.•Based on the fabricated IZO TFTs, comprehensive and sufficient experimental data on capacitance was tested in the article. A unified and complete capacitance model of metal oxide thin-film transistors (MO TFTs) based on three-terminal charges is proposed in this paper. The analytical expression of the three-terminal charges is obtained with the effective charge density approach and the Ward-Dutton charge partitioning approach. By considering the non-reciprocal capacitance between any two terminals, the complete capacitance model of the MO TFTs is proposed with an accurate description. The proposed model has a uniform and analytical capacitance expression over the full working regions with a specific physical meaning based on the surface potential solution. Furthermore, the sufficient capacitance experimental data of the fabricated IZO-TFT are presented to verify the proposed model. It is shown that there is a good agreement between the experimental data and the proposed model in a wide range of working regions.
ISSN:0038-1101
1879-2405
DOI:10.1016/j.sse.2024.108976