Evidence of structural modulations induced by a charge density wave transition in orthorhombic Sm2Ru3Ge5

We present the electrical resistivity and x-ray diffraction characterization of ternary Sm2Ru3Ge5 compound with orthorhombic U2Co3Si5-type structure. In agreement with the earlier observations, our electrical resistivity measurements revealed the presence of three anomalies, viz. 239.3, 27.8 and 7 K. The first one is connected to a charge density wave (CDW) transition, while the last one is connected to an antiferromagnetic (AFM) transition. Our systematic synchrotron powder diffraction data in the temperature range 390 to 160 K revealed that the system remains in the orthorhombic symmetry in this temperature range. The data however revealed a clear discontinuity in the lattice parameters below ∼233 K. This observation indicates a close connection between the CDW transition and structural modulation in this system. •Electrical resistivity and synchrotron x-ray diffraction of orthorhombic Sm2Ru3Ge5•Temperature dependent x-ray diffraction covering charge-density-wave transition (CDW)•Close connection between CDW and structural modulation in orthorhombic Sm2Ru3Ge5