Pixelated silicon detector for radiation beam profile measurements

A pixelated silicon detector, developed originally for particle physics experiments, was used for a beam profile measurement of a cobalt-60 (Co-60) irradiator in a water phantom. The beam profile was compared to a profile measured with a pinpoint ionization chamber. The differences in the pixel dete...

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Veröffentlicht in:Radiation measurements 2023-07, Vol.165, p.106949, Article 106949
Hauptverfasser: Tikkanen, J., Kirschenmann, S., Kramarenko, N., Brücken, E., Koponen, P., Luukka, P., Siiskonen, T., Turpeinen, R., Ott, J.
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Sprache:eng
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Zusammenfassung:A pixelated silicon detector, developed originally for particle physics experiments, was used for a beam profile measurement of a cobalt-60 (Co-60) irradiator in a water phantom. The beam profile was compared to a profile measured with a pinpoint ionization chamber. The differences in the pixel detector and pinpoint chamber relative profiles were within approximately 2% of profile maximum, and after calculating correction factors with Monte Carlo simulations for the pixel detector, the maximum difference was decreased to approximately 1% of profile maximum. The detector’s capability to measure pulse-height was used to record an electron pulse-height spectrum in water in the Co-60 beam, and the results agreed well with simulations. •A pixelated silicon detector was used for Co-60 beam profile measurements in water.•Profiles agreed with ionization chamber results within 2% of the profile maximum.•Difference was reduced after applying Monte Carlo calculated correction factors.•A pulse height spectrum was measured with the detector in a water phantom.
ISSN:1350-4487
1879-0925
DOI:10.1016/j.radmeas.2023.106949