Pixelated silicon detector for radiation beam profile measurements
A pixelated silicon detector, developed originally for particle physics experiments, was used for a beam profile measurement of a cobalt-60 (Co-60) irradiator in a water phantom. The beam profile was compared to a profile measured with a pinpoint ionization chamber. The differences in the pixel dete...
Gespeichert in:
Veröffentlicht in: | Radiation measurements 2023-07, Vol.165, p.106949, Article 106949 |
---|---|
Hauptverfasser: | , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | A pixelated silicon detector, developed originally for particle physics experiments, was used for a beam profile measurement of a cobalt-60 (Co-60) irradiator in a water phantom. The beam profile was compared to a profile measured with a pinpoint ionization chamber. The differences in the pixel detector and pinpoint chamber relative profiles were within approximately 2% of profile maximum, and after calculating correction factors with Monte Carlo simulations for the pixel detector, the maximum difference was decreased to approximately 1% of profile maximum. The detector’s capability to measure pulse-height was used to record an electron pulse-height spectrum in water in the Co-60 beam, and the results agreed well with simulations.
•A pixelated silicon detector was used for Co-60 beam profile measurements in water.•Profiles agreed with ionization chamber results within 2% of the profile maximum.•Difference was reduced after applying Monte Carlo calculated correction factors.•A pulse height spectrum was measured with the detector in a water phantom. |
---|---|
ISSN: | 1350-4487 1879-0925 |
DOI: | 10.1016/j.radmeas.2023.106949 |