Super-oscillatory lattices structured illumination microscopy beyond two-fold resolution enhancement
•Linear programming method for creating two-dimensional super-oscillatory lattices with high efficiency based on diffractive optics•A diffractive optical element that produces a two-dimensional lattice with 10% higher spatial frequency than the cut-off frequency•The first demonstration of generating...
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Veröffentlicht in: | Optics and lasers in engineering 2024-02, Vol.173, p.107912, Article 107912 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | •Linear programming method for creating two-dimensional super-oscillatory lattices with high efficiency based on diffractive optics•A diffractive optical element that produces a two-dimensional lattice with 10% higher spatial frequency than the cut-off frequency•The first demonstration of generating super-oscillatory lattices by diffractive optics, making a compact system available•A far-field super-resolution microscopy system based on super-oscillatory lattices that breaks the two-fold resolution enhancement limit of linear structured illumination microscopy
Super-oscillatory (SO) lattices are multi-lobes patterns that exhibit local spatial frequencies beyond the bandwidth limit of their Fourier spectrum. However, the method generates SO lattices by interfering multiple beams requires complicated optical systems to control the contribution of different beams. In this paper, we present a novel approach for creating SO lattices based on diffractive optics, which simplifies the system design and implementation. Using this method, we design a diffractive optical element (DOE) that produces a two-dimensional SO lattice with a local spatial frequency exceeding the cut-off frequency by 10%. To the best of our knowledge, this is the first demonstration of generating a SO lattice by diffractive optics. We then apply the SO lattice to structured illumination microscopy (SOL-SIM) and evaluate its super-resolution performance through experiments. The results demonstrate that our method provides a new perspective to break the two-fold resolution enhancement limit of linear SIM in far-field super-resolution microscopy domain. |
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ISSN: | 0143-8166 |
DOI: | 10.1016/j.optlaseng.2023.107912 |