Optimization of the surface area of laser-induced layers for PET detectors with depth-of-interaction

Detectors with depth-of-interaction (DOI) information are utilized in positron emission tomography (PET) scanners to improve the sensitivity of radiation detection and the uniformity of spatial resolution. We recently developed a series of dual-ended detectors using crystal bars segmented by applying the subsurface laser engraving (SSLE) technique to 7, 13 and 20 DOI segments. It is crucial to achieve the submillimeter level spatial resolution for our detector as the narrow crystal bars are highly fragile after applying the SSLE technique. In this work, we focused on optimizing the surface area of the SSLE-induced layer to the narrow crystal bars in order to resolve the issue of fragility while maintaining sufficient crystal segment separation. The SSLE layers were induced to the middle of the cross section of the five crystal bars with dimensions of 1.5 ×1.5× 20 mm3 with a distance of 0.1, 0.2, 0.3, 0.4 or 0.5 mm from the two opposite lateral edges of each crystal bar. All crystals were segmented into four DOI segments and the performances of the five sets of dual-ended DOI detectors consisting of one crystal bar were evaluated from the viewpoints of optimum crystal segment identification and energy resolution while mitigating the fragility issue. The 3D position maps of the detectors were obtained by the Anger-type calculation, and the crystal identification performance was evaluated. Clear separation of the segments with a distance-to-width ratio (DWR) larger than 7 was obtained for the detectors in which the distances of the SSLE-induced layer from the two opposite lateral edges of the crystal were 0.1, 0.2 and 0.3 mm. The DWR for the other two detectors was less than 4.4. Average energy resolutions of 11.8 ± 0.2%, 10.6 ± 0.2% and 8.8 ± 0.2% were obtained for the detectors in which the SSLE layers were induced with 0.1, 0.3 and 0.5 mm distances from the two opposite lateral edges of the crystal, respectively. There was a compromise between energy resolution and crystal segment identification. The optimum surface area of the SSLE-induced layer was accepted as a trade-off between crystal segment identification and fragility. The crystal segmented by the SSLE-induced layer at the middle of the cross section with a distance of 0.3 mm from the two opposite lateral edges was considered to be a good candidate with acceptable performance and fragility.