A machine learning surrogate model for time of flight diffraction measurements of rough defects

Understanding the uncertainty in nondestructive evaluation measurements of rough defects requires a stochastic analysis due to the random variation between the morphology of different defects. In previous studies, large numbers of finite element models of randomly generated rough defects have been run in order to gain an insight into the statistics of the uncertain results. This approach is limited due to the time taken to run each individual model (typically of the order of minutes per model) and so the total number of models run is limited. In this paper, a surrogate model approach is proposed which produces close approximations to an original finite element model of a time-of-flight diffraction measurement, but in a small fraction of the time (