Design and analysis of a fault tolerance nano-scale code converter based on quantum-dots

Quantum-dot cellular automata (QCA), a nano-scale computer framework, is developing as a potential alternative to current transistor-based technologies. However, it is susceptible to a variety of fabrication-related errors and process variances because it is a novel technology. As a result, QCA-based circuits pose reliability-related problems since they are prone to faults. To address the dependability challenges, it is becoming increasingly necessary to create fault-tolerance QCA-based circuits. On the other hand, the applications of code converters in digital systems are essential for rapid signal processing. Using fault-tolerance XOR and multiplexer, this research suggests a nano-based binary-to-gray and gray-to-binary code converter circuit in a single layer to increase efficiency and reduce complexity. The fault-tolerance performance of the suggested circuits against cell omission, misalignment, displacement, and extra cell deposition faults has significantly improved. Concerning the generalized design metrics of QCA circuits, the fault-tolerance designs have been contrasted with the existing structures. The proposed fault-tolerance circuits' energy dissipation findings have been calculated using the precise QCADesigner-E power estimator tool. Using the QCADesigner-E program, the proposed circuits' functionality has been confirmed. The results implied the high efficiency and applicability of the proposed designs.