In-situ microscopy methods for imaging high-temperature microstructural processes – Exploring the differences and gaining new potentials

In-situ high-temperature microscopy techniques provide crucial insights into materials under non-ambient conditions. This study compares confocal laser scanning and scanning electron microscopy for material characterization at elevated temperatures. Thereby, investigations are made regarding their imaging capabilities, limitations, and the general information obtained. Two alloys, Cu-20 m.% Sn and W-10 m.% Re, are used as case studies to demonstrate the applicability of the techniques. By studying phenomena such as grain growth, phase transformations, and thermal crack, we gain important insights to understand mechanical properties and thermal behavior better. This comprehensive analysis aids in selecting the most appropriate microscopy technique based on the research objectives. Overall, this study helps advance high-temperature materials science and promotes progress in several areas requiring accurate materials characterization under high thermal conditions. [Display omitted] •Benchmarking of HT-SEM and HT-CLSM regarding in-situ application using applied copper and tungsten alloys.•Complementary insights on transient material phenomena using bulk-like specimens.•Visualization of thermal crack behavior and topographic changes in W–Re.•New knowledge of temperature-dependent microstructure to predictmechanical properties and as input for machine learning.•Decision matrix aiding selection of HT-CLSM or HT-SEM based on research objectives.