Micro/nanopositioning coplanar stage with real-time compensation of volumetric error

•A micro/nanopositioning coplanar stage with real-time compensation of the volumetric error was designed.•A volumetric error measuring unit was designed to simultaneously real-time measure 13 geometric error components.•A novel volumetric error model was established using the Abbe and Bryan principl...

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Veröffentlicht in:Measurement : journal of the International Measurement Confederation 2024-04, Vol.229, p.114424, Article 114424
Hauptverfasser: Cai, Yindi, Zhang, Zeguang, Zhang, Dianpeng, Wang, Ruyue, Fan, Kuang-Chao
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Sprache:eng
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Zusammenfassung:•A micro/nanopositioning coplanar stage with real-time compensation of the volumetric error was designed.•A volumetric error measuring unit was designed to simultaneously real-time measure 13 geometric error components.•A novel volumetric error model was established using the Abbe and Bryan principles.•A control unit was improved to real-time compensate volumetric error and high-precision control position and velocity.•The actual positional error of the micro/nanopositioning coplanar stage has been reduced by approximately 97.6 %. A micro/nanopositioning coplanar stage is designed with real-time compensation of volumetric error. According to the topological structure of the stage, it has 13 geometric error components. Furthermore, there are positional shifts of a functional point from the displacement feedback point and the measurement point of geometric errors. To improve the positional accuracy, it is crucial to real-time measure, model, and compensate for the volumetric error at the functional point. Therefore, a volumetric error measuring unit (VEMU) is designed to simultaneously real-time measure 13 geometric error components. A volumetric error model is established using the Abbe and Bryan principles. A control unit with two backpropagation neural networks-based PID controllers combines with the VEMU and volumetric error model to realize the real-time compensation of the volumetric error. The positional error of the micro/nanopositioning coplanar stage is reduced approximately 97.6 %, from which the effectiveness and applicability of the proposed methods are verified.
ISSN:0263-2241
1873-412X
DOI:10.1016/j.measurement.2024.114424