An algorithm for resolving intragranular orientation fields using coupled far-field and near-field high energy X-ray diffraction microscopy

We present a novel algorithm for reconstructing spatial intragranular lattice orientation fields using both far-field and near-field high energy X-ray diffraction microscopy (HEDM) measurements. An established far-field indexing algorithm is modified to include lattice orientation distribution information (grain orientation envelopes) in addition to average grain orientations. The near-field data reduction algorithm utilizes this enriched far-field orientation data as a seed for reconstructing intragranular spatial maps of lattice orientation from the diffraction images. The primary benefit of the new algorithm is a significant decrease in the number of trial calculations that must be performed in the reconstruction process compared to existing methodologies while maintaining scalability. The resulting gains in efficiency facilitate the use of relatively modest computational resources and improve throughput at the point of measurement. We provide two example applications: volumetric orientation field reconstructions for a Ti-Al alloy both before and after the application of 3% uniaxial strain. The results showcase the efficiency of the new method and the ability to resolve subtle changes in microstructure, which are associated with incipient plastic deformation. •Combined far-field and near-field HEDM framework efficiently extracts spatially resolved intragranular orientation fields•Algorithm automatically registers far-field and near-field datasets•Computation demands significantly reduced such that single workstation reconstructions are feasible