Classification of pulse flours using near-infrared hyperspectral imaging

With increasing consumer interest in healthy food formulations made from pulse flours, the research gap in characterizing them based on their pulse type and milling technique has come to limelight. To this end, the feasibility of using hyperspectral imaging in the visible near infrared (Vis-NIR) (400–1000 nm) and short wave infrared (SWIR) (1000–2500 nm) regions to classify pulse flours (viz. chickpea, yellow pea, navy bean and green lentil) based on the pulse type and milling methods was investigated. Unsupervised and supervised classification models were developed using unsupervised principal component analysis (PCA) and supervised partial least squares discriminant analysis (PLS-DA). Supervised classification for pulse flour type demonstrated 100% accuracy in the Vis-NIR wavelength range of 530–700 nm, which primarily exploited the color attributes of the flour samples. For milling method based classification, PLS-DA models developed using SWIR regions of 1370–1500 nm and 1700–2000 nm played a significant role in discriminating flour samples yielding 95% classification accuracy. These regions are associated with the O–H and N–H overtones of the proteins found in flour samples. Conclusively, hyperspectral imaging in the range of 400–2500 nm combined with multivariate data classification methods can reliably be used by the food industry for characterization of pulse flours. •Wavelength region from 530 to 700 nm effectively classified flours based on pulse types•Wavelengths associated with protein in SWIR region discriminated samples based on milling method•Supervised classification maps depicted accuracies in the range of 95–100%•Hyperspectral imaging is a reliable tool for pulse flour characterization