Selective growth and unveiling semiconductor nanostructured based La,Mo and O elements: Structural, morphological, and optical investigations

La2Mo2O9 ternary compound thin film has been prepared by the chemical spray pyrolysis technique on glass substrates at 460°C. Characterization via X-ray diffraction (XRD), Raman spectroscopy, scanning electron microscopy (SEM), energy dispersive X-ray, X-ray photoelectron spectrometry (XPS) and spectrophotometry through reflectance and transmittance measurements were performed. X-ray analysis shows that La2Mo2O9 material crystallizes in cubic structure belonging to the P 213 space group with a preferred orientation of the crystallites along (210) direction parallel to the substrate plane. Raman spectroscopy witnesses the presence of bonds like La-O and Mo-O. SEM observation shows that the prepared film exhibits a uniform grain of regular sizes in the range of 70–120 nm and some chains. EDX spectroscopy highlights the presence of La, Mo and O elements with a slight non-stoichiometry reflecting the oxygen deficiency. XPS measurements reveal the well defined states O 1s, Mo 3d5/2, Mo 3d3/2, La 3d5/2 and La 3d3/2 of oxygen, molybdenum and lanthanum elements. Optical measurements show a high transparency in the visible range. These measurements were used to deduce the optical band gap and Urbach energy. •La2Mo2O9 thin films were synthesized by spray process.•X ray diffraction analysis shows a cubic structure of these films with (210) preferential orientation.•SEM observations show nanometric behaviour of La2Mo2O9 prepared thin film.•The optical properties performed by spectrophotometeric measurements show a direct transition of La2Mo2O9 material with a Cauchy dispersion of the refractive index.•XPS measurement compliant with La, Mo and O elements.